COBISS Kooperativni online bibliografski sistem in servisi COBISS
dr. Jože Furlan [01924]
Reprezentativne bibliografske enote
ČLANKI IN DRUGI SESTAVNI DELI
1.01 Izvirni znanstveni članek
1.
SMOLE, Franc, TOPIČ, Marko, FURLAN, Jože, KUSIAN, Wilhelm. Hump-shaped internal collection
efficiency of degraded a-Si:H p-i-n solar cells. Journal of applied physics. 1997, vol. 82, no. 2, str. 878-882. ISSN 0021-8979. [COBISS.SI-ID 396116]
2.
POPOVIĆ, Pavle, BASSANESE, Elvis, SMOLE, Franc, FURLAN, Jože. Numerical analysis of
the transient response in amorphous silicon. Journal of applied physics. 1997, vol. 82, no. 9, str. 4504-4507. ISSN 0021-8979. [COBISS.SI-ID 661588]
3.
TOPIČ, Marko, SMOLE, Franc, FURLAN, Jože, FORTUNATO, Elvira, MARTINS, Rodrigo. Analysis
of front contact heterojunction in a-Si:H one-dimensional position sensitive detectors.
Review of scientific instruments. 1997, vol. 68, no. 3, str. 1377-1381. ISSN 0034-6748. [COBISS.SI-ID 395860]
4.
TOPIČ, Marko, SMOLE, Franc, FURLAN, Jože. Band-gap engineering in CdS/Cu(In,Ga)Se2
solar cells. Journal of applied physics. 1996, vol. 79, no. 11, str. 8537-8540. ISSN 0021-8979. [COBISS.SI-ID 412500]
5.
FURLAN, Jože, SKUBIC, Ivan, SMOLE, Franc, POPOVIĆ, Pavle, TOPIČ, Marko. Small-signal
capacitance and conductance of biased a-Si structures. Journal of applied physics. 1996, let. 80, št. 7, str. 3854-3859, graf. prikazi. ISSN 0021-8979. [COBISS.SI-ID
869204]
6.
SMOLE, Franc, TOPIČ, Marko, FURLAN, Jože. Analysis of TCO/p(a-SI:C:H) heterojunction
and its influence on p-i-n a-Si:H solar cell performance. Journal of non-crystalline solids. [Print ed.]. 1996, vol. 194, str. 312-318, graf. prikazi. ISSN 0022-3093. [COBISS.SI-ID
414292]
7.
TOPIČ, Marko, SMOLE, Franc, FURLAN, Jože, KUSIAN, Wilhelm. Stacked a-SiC:H/a-Si:H
heterostructures for bias-controlled three-colour detectors. Journal of non-crystalline solids. [Print ed.]. 1996, vol. 198-200, str. 1180-1184. ISSN 0022-3093. [COBISS.SI-ID 412756]
8.
POPOVIĆ, Pavle, BASSANESE, Elvis, FURLAN, Jože, SMOLE, Franc, SKUBIC, Ivan. Internal
and external charachteristics in transient forward bias simulations of a-Si:H devices.
Journal of non-crystalline solids. [Print ed.]. 1995, vol. 191, str. 184-192, graf. prikazi. ISSN 0022-3093. [COBISS.SI-ID
414036]