Tomo Mrdjen

1. CVIKL, Bruno, MRDJEN, Tomo, KOŽELJ, Matjaž, KRAMBERGER, Miran. I-V karakteristike Ag/n-Si(111) Schottky-jeve bariere nanesene po metodi curka ioniziranih skupkov, CIS. Vakuumist : glasilo Društva za vakuumsko tehniko Slovenije. [Tiskana izd.]. 1993, let. 13, št. 2, str. 26-30. ISSN 0351-9716. http://www.dlib.si/details/URN:NBN:SI:doc-ER929RR9, Digitalna knjižnica Univerze v Mariboru – DKUM. [COBISS.SI-ID 5495044]

2. CVIKL, Bruno, MRDJEN, Tomo, KOŽELJ, Matjaž, KRAMBERGER, M. I-V karakteristike Ag/n-Si(111) Schottky-jeve bariere nanešene po metodi curka ioniziranih skupkov, CIS. V: 1. Susret vakuumsita Hrvatske i Slovenije, Zagreb, 21.4.1993. [S.l.]: [s.n.], 1993. Str. 2. [COBISS.SI-ID 5496324]

3. CVIKL, Bruno, MRDJEN, Tomo. I-V characteristics of ionized cluster beam deposited Ag/n-Si(111) Schottky diode. Fizika : a journal of experimental and theoretical physics. A, Atomic and molecular physics, condensed matter physics, plasma physics. 1995, vol. 4, str. 403-412. ISSN 1330-0008. [COBISS.SI-ID 7899908]

4. CVIKL, Bruno, HORVÁTH, Zsolt, MRDJEN, Tomo. Investigation of possible anomalous thermionic field emission in ICB deposited Ag/n-Si(111) junctions. V: ŠORLI, Iztok (ur.), KREN, Brane (ur.), LIMPEL, Meta (ur.). Proceedings. 23rd International Conference on Microelectronics - MIEL 95 [and] 31st Symposium on Devices and Materials - SD 95, September 27. - September 29.1995,Terme Zreče-Rogla, Slovenia. Ljubljana: MIDEM, 1995. Str. 391-396. ISBN 961-90001-3-7. [COBISS.SI-ID 7767556]

5. MRDJEN, Tomo, CVIKL, Bruno, KOROŠAK, Dean. Investigation of the response time of ICB deposited Ag/n-Si(111) Schottky photodiode. V: ŠORLI, Iztok (ur.), KREN, Brane (ur.), LIMPEL, Meta (ur.). Proceedings. 23rd International Conference on Microelectronics - MIEL 95 [and] 31st Symposium on Devices and Materials - SD 95, September 27. - September 29.1995,Terme Zreče-Rogla, Slovenia. Ljubljana: MIDEM, 1995. Str. 327-390. ISBN 961-90001-3-7. [COBISS.SI-ID 7767300]

6. CVELBAR, Andrej, PANJAN, Peter, NAVINŠEK, Boris, MRDJEN, Tomo, ZALAR, Anton. Meritve električne upornosti v tankih plasteh Cr med oksidacijo : predstavljeno na 2. slovenski konferenci o materialih in tehnologijah, Portorož, 1994 = Electrical resistivity measurement in thin Cr films during oxidation. Kovine zlitine tehnologije. 1995, letn. 29, št. 1/2, str. 313-314. ISSN 1318-0010. http://www.dlib.si/details/URN:NBN:SI:doc-S5KZMNVY. [COBISS.SI-ID 12258]

7. CVIKL, Bruno, MRDJEN, Tomo, KOŽELJ, Matjaž, KOROŠAK, Dean. Preliminary investigation of Ag/n-Si(111) Schottky photodiode prepared by ionized-cluster-beam deposition. Fizika : a journal of experimental and theoretical physics. A, Atomic and molecular physics, condensed matter physics, plasma physics. 1995, 4, 3, str. 389-394. ISSN 1330-0008. [COBISS.SI-ID 7899396]

8. MRDJEN, Tomo, STEPIŠNIK, Janez. Električne karakteristike Schottkyjevih diod Ag/Si, izdelanih z metodo nanašanja s curki ioniziranih delcev : magistrsko delo. Ljubljana: [T. Mrdjen], 1996. IV, 90 str., graf. prik. [COBISS.SI-ID 4193302]

9. MRDJEN, Tomo, CVIKL, Bruno, KOROŠAK, Dean. Investigation of spatially confined Ag deep impurities energy levels effect on the I-V and C-V characteristics of ICB deposited Ag/n-Si(111) Schottky diodes. V: ŠORLI, Iztok (ur.), AMON, Slavko (ur.), KOSEC, Marija (ur.). Proceedings. 24th International Conference on Microelectronics and 32nd Symposium on Devices and Materials, September 25.-27. 1996, Nova Gorica. Ljubljana: MIDEM, 1996. Str. 377-382. ISBN 961-90001-4-5. [COBISS.SI-ID 2198294]

10. KOROŠAK, Dean, CVIKL, Bruno, MRDJEN, Tomo. On correlation between ICB deposited metal/Si layers growth and possible occurence of the disorder induced semiconductor gap states, DIGS. V: ŠORLI, Iztok (ur.), AMON, Slavko (ur.), KOSEC, Marija (ur.). Proceedings. 24th International Conference on Microelectronics and 32nd Symposium on Devices and Materials, September 25.-27. 1996, Nova Gorica. Ljubljana: MIDEM, 1996. Str. 303-308. ISBN 961-90001-4-5. [COBISS.SI-ID 2198038]