Andreas Gerber

1. BOKALIČ, Matevž, PIETERS, Bart Elger, GERBER, Andreas, RAU, Uwe, TOPIČ, Marko. Bandgap imaging in ▫$Cu(In,Ga)Se_2$▫ photovoltaic modules by electroluminescence. Progress in photovoltaics : research and applications. Feb. 2017, vol. 25, no. 2, str. 184-191, ilustr. ISSN 1062-7995. http://onlinelibrary.wiley.com/doi/10.1002/pip.2846/full, Repozitorij Univerze v Ljubljani – RUL, DOI: 10.1002/pip.2846. [COBISS.SI-ID 11645780]

2. BOKALIČ, Matevž, GERBER, Andreas, PIETERS, Bart Elger, RAU, Uwe, TOPIČ, Marko. Bandgap fluctuations observed by EL in various ▫$Cu(In,Ga)(Se,S)_2$▫ PV modules. IEEE journal of photovoltaics. 1 Jan. 2018, vol. 8, no. 1, str. 272-277, ilustr. ISSN 2156-3381. http://ieeexplore.ieee.org/document/8089672/, Repozitorij Univerze v Ljubljani – RUL, DOI: 10.1109/JPHOTOV.2017.2762589. [COBISS.SI-ID 11923028]

3. BOKALIČ, Matevž, TOPIČ, Marko, PIETERS, Bart Elger, GERBER, Andreas, RAU, Uwe. Method and device for the determination of a measure of band gaps at optoelectronic components = Verfahren und eine Vorrichtung zur Bestimmung einer Messung von Bandlücken bei optoelektronischen Komponenten = Procédé et dispositif pour la détermination d'une mesure de bandes interdites au niveau de composants optoélectroniques : European patent specification EP 3 394 979 B1, 2019-09-18. Munich: European Patent Office, 2019. 12 str., ilustr. [COBISS.SI-ID 12725844]
patentna družina: EP3394979 (A1), 2018-10-31; DE102015226708, 2015-12-23; DE102015226708 (A1), 2017-06-29; WO2017108511 (A1), 2017-06-29