COBISS Co-operative Online Bibliographic system & services COBISS
PhD Anton Zalar [01741]
Representative bibliographic units
ARTICLES AND OTHER COMPONENT PARTS
1.01 Original scientific article
1.
ZALAR, Anton, BARETZKY, B., DETTENWANGER, F., RÜHLE, M., PANJAN, Peter, et al. Interdiffusion
at he ▫$Al_2O_3/Ti$▫ interface studied in thin-film structures. Surface and interface analysis. October 1998, vol. 26, no. 11, str. 861-867, graf. prikazi. ISSN 0142-2421. [COBISS.SI-ID
13598247]
2.
ZALAR, Anton, HOFMANN, S., PIMENTEL, F., KOHL, D., PANJAN, Peter, et al. Early-stage
diffusion processes at Si/Me and Me/Me interfaces. Vacuum. [Print ed.]. 1995, vol. 46, no. 8-10, str. 1077-1081. ISSN 0042-207X. [COBISS.SI-ID
10629415]
3.
HOFMANN, S..., ZALAR, Anton. Depth profiling with sample rotation: capabilities and
limitations. Surface and interface analysis. 1994, vol. 21, str. 304-309, graf. prik. ISSN 0142-2421. [COBISS.SI-ID 11234]
4.
ZALAR, Anton, HOFMANN, S., PIMENTEL, F., PANJAN, Peter. Interfacial reactions and
silicide formation in Si/Ni/Si and Si/Cr/Si sandwich layers. Surface and interface analysis. 1994, vol. 21, str. 560-565. ISSN 0142-2421. [COBISS.SI-ID 9358119]
5.
ZALAR, Anton, SEIBT, E. W., PANJAN, Peter. Auger electron spectroscopy rotational
depth profiling of Ni/Cr multilayers using (O[sub]2[sup]+) and Ar[sup]+ ions. Thin solid films. [Print ed.]. 1994, vol. 246, str. 35-41. ISSN 0040-6090. [COBISS.SI-ID 9167911]
6.
ZALAR, Anton, HOFMANN, S... Comparison of rotational depth profiling with AES and
XPS. Applied Surface Science. [Print ed.]. 1993, vol. 68, str. 361-367, graf. prik. ISSN 0169-4332. [COBISS.SI-ID
9442]
7.
HOFMANN, S., ZALAR, Anton, PANJAN, Peter. Interlaboratory comparison of the depth
resolution in sputter depth profiling of Ni/Cr multilayers with and without sample
rotation using AES, XPS ans SIMS. Surface and interface analysis. 1993, vol. 20, str. 621-626, graf. prik. ISSN 0142-2421. [COBISS.SI-ID 9186]
8.
ZALAR, Anton, PANJAN, Peter, KRAŠEVEC, Viktor, HOFMANN, S. Alternative model multilayer
structures of depth profiling studies. Surface and interface analysis. 1992, vol. 19, str. 50-54. ISSN 0142-2421. [COBISS.SI-ID 13896999]
9.
ZALAR, Anton, HOFMANN, S., PANJAN, Peter, KRAŠEVEC, Viktor. Auger electron spectroscopy
depth profiling studies on stationary and rotated samples of a new model metal/semiconductor
multilayer structure. Thin solid films. [Print ed.]. 1992, vol. 220, str. 191-196. ISSN 0040-6090. [COBISS.SI-ID 13896487]