M. Yang

1. ZHENG, H., GAO, X., YANG, X., JING, G., YANG, M., LIU, Y. A multi-objective feature selection and self-paced ensemble framework for semiconductor defect detection. Advances in production engineering & management. Dec. 2025, vol. 20, no. 4, str. 458-474, ilustr. ISSN 1854-6250. Digital Library of the University of Maribor – DLUM, http://www.dlib.si/details/URN:NBN:SI:doc-PASCPMEJ, DOI: 10.14743/apem2025.4.552. [COBISS.SI-ID 265921027]