1. PANJAN, Peter, NAVINŠEK, Boris, ČEKADA, Miha, ZALAR, Anton. Oxidation behaviour of TiAlN coatings sputtered at low temperature. Vacuum. [Print ed.]. 1999, vol.53, str. 127-131. ISSN 0042-207X. [COBISS.SI-ID 14065191]

2. PANJAN, Peter, NAVINŠEK, Boris, CVELBAR, Andrej, ZALAR, Anton, VLCEK, J. High-temperature oxidation of TiN/CrN multilayers reactively sputtering at low temperatures. Surface & coatings technology. [Print ed.]. 1998, vol. 98, str. 1497-1502. ISSN 0257-8972. [COBISS.SI-ID 13321511]

3. NAVINŠEK, Boris, PANJAN, Peter, MILOŠEV, Ingrid. Industrial applications of CrN (PVD) coatings, deposited at high and low temperatures. Surface & coatings technology. [Print ed.]. 1997, vol. 97, str. 182-191. ISSN 0257-8972. [COBISS.SI-ID 13071911]

4. PANJAN, Peter, NAVINŠEK, Boris, CVELBAR, Andrej, ZALAR, Anton, MILOŠEV, Ingrid. Oxidation of TiN, ZrN, TiZrN, CrN, TiCrN and TiN/CrN multilayer hard coatings reactivity sputtered at low temperature. Thin solid films. [Print ed.]. 1996, vol. 281-282, str. 298-301. ISSN 0040-6090. [COBISS.SI-ID 14818]

5. HOFMANN, S., ZALAR, Anton, PANJAN, Peter. Interlaboratory comparison of the depth resolution in sputter depth profiling of Ni/Cr multilayers with and without sample rotation using AES, XPS ans SIMS. Surface and interface analysis. 1993, vol. 20, str. 621-626, graf. prik. ISSN 0142-2421. [COBISS.SI-ID 9186]

6. PANJAN, Peter, NAVINŠEK, Boris, ŽABKAR, Anton, MARINKOVIĆ, Velibor, MANDRINO, Djordje, FIŠER, Jožko. Structural analysis of Zr-N and Ti-N films prepared by reactive plasma beam deposition. Thin solid films. [Print ed.]. 1993, vol. 228, str. 233-237. ISSN 0040-6090. [COBISS.SI-ID 5923623]

7. PANJAN, Peter, NAVINŠEK, Boris, ŽABKAR, Anton, FIŠER, Jožko, ZALAR, Anton. Characterization of ▫$TiN_x$▫ and ▫$ZrN_x$▫ multilayered structures by Auger electron spectroscopy. Vacuum. [Print ed.]. 1990, vol. 40, str. 81-84. ISSN 0042-207X. [COBISS.SI-ID 14114599]

8. PANJAN, Peter, ŽABKAR, Anton, NAVINŠEK, Boris, DEMŠAR, A., ŠVAJGER, A. Optical properties of nitride coatings deposited at low substrate temperatures. Vacuum. [Print ed.]. 1990, vol. 40, str. 161-164. ISSN 0042-207X. [COBISS.SI-ID 14115367]

9. PANJAN, Peter, NAVINŠEK, Boris, ŽABKAR, Anton, GODEC, Matjaž, KRIVOKAPIČ, Zoran, ZALAR, Anton, PRAČEK, Borut. TiSi2 formation during annealing of sputtered Ti, Ti/TiN and TiNx thin films. Vacuum. [Print ed.]. 1990, vol. 40, str. 169-171. ISSN 0042-207X. [COBISS.SI-ID 14115111]

10. PANJAN, Peter, NAVINŠEK, Boris, ZORKO, Benjamin, ZALAR, Anton. The determination of nitrogen in Cr-N system by RBS and the weight gain technique. In: PETTY, M. (ed.), JACKMAN, Richard B. (ed.). Proceedings of the Thin Film and Electronic Materials and Processing sessions from the 14th International Vacuum Congress, Birmingham, UK, 31 August - 4 September 1998. Amsterdam [etc.]: Elsevier, 1999. Str. 265-268. Thin solid films, vol. 343-344, 1999. ISSN 0040-6090. [COBISS.SI-ID 14239271]